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Porous End-Effector
Usage Environment/SpecificationsProduct Profile
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Characteristics
Suitable for handling warped wafer or thin wafer that cannot be held properly with the standard vacuum suction type end-effector.
High purity alumina ceramic sintered body is used for the main body of end-effector, and porous ceramic is used for the wafer suction surface.
Compared with end-effectors that suction wafer by digging a ditch on the suction surface by approximately 1.5mm, the average micropore diameter of 20 µm can disperse suction pressure centering around the ditch. With this, Porous end-effector can hold thin wafer without deformation.
Particle size of mesh is selectable from Grade#100, #220, to #400.
Conductive Teflon coating is available for suction surface.
Standard Specifications
Material | High purity alumina ceramic sintered body |
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Material of Suction Surface | Porous ceramic |
Wafer Holding Method | Vacuum suction |
Thickness | 3mm |
Particle Size of Mesh | 44 to 74µm(Grade#220) |
Average Micropore Diameter | 20µm(Grade#220) |
Contact us for the detailed specifications.
Icon guide
- ...Atmosphere
- ...Vacuum
- ...Waterproof
- ...Single arm
- ...Twin arm
- ...Thin wafer
- ...CE marking
- ...JEL's standard spec.
- ...KCs marking